Refraction-contrast X-ray CT for Analyzing Three-dimensional Structures of Pathological Samples

• SUNAGUCHI Naoki

  Graduate School of Medicine, Nagoya University

• SHIMAO Daisuke

  Department of Radiological Technology, Hokkaido University of Science

• ICHIHARA Shu

  Department of Pathology, Nagoya Medical Center

• KAWASAKI Tomonori

  Department of Pathology, Nagoya Medical Center

• MORI Kensaku

  Graduate School of Information Science, Nagoya University

• YUASA Tetsuya

  Graduate School of Engineering and Science, Yamagata University

• ANDO Masami

  Research Institute of Science and Engineering, Tokyo University of Science

Bibliographic Information

Other Title

• 屈折コントラストX線CT撮像法と病理サンプルの三次元構造解析

Abstract

Refraction-based computed tomography using x-ray dark-field imaging(XDFI-CT), proposed by M. Ando in 2002, can obtain high-definition three-dimensional structures of biomedical samples. Since the advent of XDFI-CT, many methods including hardware and software techniques have been developed to improve the image quality and the imaging efficiency. In the paper, we first introduce the imaging principle of XDFI-CT, and then outline the reconstruction techniques to suppress artifacts and to reduce the views, which have been recently developed for XDFI-CT. Finally, we demonstrate the XDFI-CT images acquired from several pathological samples, such as human iliac artery, human liver, and human breast nipple, to show the effectiveness.

Journal

• Medical Imaging Technology

  Medical Imaging Technology 36 (3), 107-113, 2018

  The Japanese Society of Medical Imaging Technology

Keywords

• X-ray dark field imaging
• Computed tomography
• Refractive indexDeep learning

Details

• CRID: 1390282763012356864
• NII Article ID: 130007384469
• DOI: 10.11409/mit.36.107
• ISSN: 21853193
• ISSN: 0288450X
• Web Site: https://search.jamas.or.jp/link/ui/2019044024
• Text Lang: ja
• Data Source:
  • JaLC
  • CiNii Articles
  • KAKEN
• Abstract License Flag: Disallowed