Energy Dissipation Detected by Frequency Modulation Atomic Force Microscopy

• ARAI Toyoko

  Institute of Science and Engineering, Kanazawa University

Bibliographic Information

Other Title

• 周波数変調原子間力顕微鏡で測定するエネルギー散逸
• シュウハスウ ヘンチョウ ゲンシ カンリョク ケンビキョウ デ ソクテイ スル エネルギー サンイツ

Abstract

Frequency modulation atomic force microscopy (FM-AFM) can simultaneously detect the conservative and non-conservative force interactions between a tip and a sample, based on the resonance frequency shift (Δf) and the mechanical energy dissipation of an oscillating cantilever, respectively. Here, we outline the energy dissipation measured by FM-AFM and introduce our recent results obtained through measurement of the energy dissipation. First, surface resistances can be evaluated in non-contact using the proportional relationship between the energy dissipation due to Joule heat and Δf due to the electrostatic attractive force. Second, Si adatoms on a Si(111)-(7×7) surface, which are observed to be static by FM-AFM, can move back and force between their stable sites and their neighboring quasi-stable sites, detected by measuring of the energy dissipation.

Journal

• Vacuum and Surface Science

  Vacuum and Surface Science 61 (10), 632-638, 2018-10-10

  The Japan Society of Vacuum and Surface Science

Keywords

• frequency modulation atomic force microscopy
• energy dissipation
• Si(111)-(7×7)

Details

• CRID: 1390282763059293440
• NII Article ID: 130007496775
• NII Article ID: 130007519357
• NII Book ID: AA12808657
• DOI: 10.1380/vss.61.632
• DOI: 10.14886/sssj2008.2018.0_50
• ISSN: 24335843
• ISSN: 24335835
• NDL BIB ID: 029307534
• Web Site: http://id.ndl.go.jp/bib/029307534
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I029307534
• Web Site: https://www.jstage.jst.go.jp/article/vss/61/10/61_20180200/_pdf
• Text Lang: ja
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
  • KAKEN
• Abstract License Flag: Disallowed