Quantitative evaluation of the maximum observable thickness by high-voltage electron microscopy
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- Sato Kazuhisa
- Research Center for UHVEM, Osaka Univ.
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- Yamashita Yuki
- Div. Mat. & Mfg Sci., Osaka Univ.
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- Yasuda Hidehiro
- Research Center for UHVEM, Osaka Univ.
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- Mori Hirotaro
- Research Center for UHVEM, Osaka Univ.
Bibliographic Information
- Other Title
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- 超高圧電子顕微鏡による観察可能試料厚さの定量評価
Journal
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- Meeting Abstracts of the Physical Society of Japan
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Meeting Abstracts of the Physical Society of Japan 72.2 (0), 2347-2347, 2017
The Physical Society of Japan
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Details 詳細情報について
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- CRID
- 1390282763065060224
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- NII Article ID
- 130007507525
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- ISSN
- 21890803
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- Text Lang
- ja
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- Data Source
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- JaLC
- CiNii Articles