Stress Measurement of Coarse Grains Using Double Exposure Method

DOI Web Site Web Site 3 Citations 5 References Open Access
  • SUZUKI Kenji
    Faculty of Education, Niigata University
  • SHOBU Takahisa
    Material Sciences Research Center, Japan Atomic Energy Agency
  • SHIRO Ayumi
    Synchrotron Radiation Research Center,National Institutes for Quantum and Radiological Science and Technology

Bibliographic Information

Other Title
  • 二重露光法による粗大粒材の応力測定
  • ニジュウ ロコウホウ ニ ヨル ソダイリュウザイ ノ オウリョク ソクテイ

Search this article

Abstract

<p>The double exposure method (DEM) is proposed herein as a new X-ray stress measurement method for coarse grain materials. A diffraction angle can be obtained from an incident and a spotty diffracted beam. Each X-ray beam is measured by an area detector on a linear motion stage on the 2 θ-arm in the DEM. To examine the validity of the DEM, the residual stress of the plastically bent specimen was measured. In addition, the residual stress distribution of the indentation specimen was measured. The result by the DEM was similar to the result simulated by the finite element method. As a result, the DEM is useful for the X-ray stress measurement method for coarse grain material.</p>

Journal

Citations (3)*help

See more

References(5)*help

See more

Related Projects

See more

Keywords

Details 詳細情報について

Report a problem

Back to top