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- Li Li
- State Key Laboratory of ASIC and System, Fudan University
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- Cheng Xu
- State Key Laboratory of ASIC and System, Fudan University
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- Zhang Zhang
- School of Electronic Science and Applied Physics, Hefei University of Technology
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- Zeng Jianmin
- School of Electronic Science and Applied Physics, Hefei University of Technology
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- Zeng Xiaoyang
- State Key Laboratory of ASIC and System, Fudan University
抄録
<p>This paper presents a low-power high-precision sigma-delta analog-to-digital converter (ADC) mainly used for DC measurement, especially in applications with high input impedance. A configurable chopping scheme is proposed to reduce the input-dependent residual offset caused by the clock feed-through. Furthermore, it also improves noise performance in the first integrator. The 1.17 mm2 chip is fabricated in a standard 65 nm CMOS process. Measurement results show that the ADC achieves 20-bit resolution, 10 ppm INL and a 0.6 µV offset, while consuming 860 µW from 3.3 V supply.</p>
収録刊行物
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- IEICE Electronics Express
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IEICE Electronics Express 16 (10), 20190176-20190176, 2019
一般社団法人 電子情報通信学会
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詳細情報 詳細情報について
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- CRID
- 1390001288140825728
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- NII論文ID
- 130007653312
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- ISSN
- 13492543
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可