X線による実装基板の可視化とCT検査の課題解決について  [in Japanese] Visualization of Substrate by Means of X-ray, and Solutions for Issues in CT Inspection  [in Japanese]

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Author(s)

    • 野口 健二 Noguchi Kenji
    • 名古屋電機工業株式会社FA検査装置カンパニー FA Inspection Equipment Company, Nagoya Electric Works Co.,Ltd.

Journal

  • Journal of The Japan Institute of Electronics Packaging

    Journal of The Japan Institute of Electronics Packaging 22(4), 275-278, 2019

    The Japan Institute of Electronics Packaging

Codes

  • NII Article ID (NAID)
    130007672068
  • NII NACSIS-CAT ID (NCID)
    AA11231565
  • Text Lang
    JPN
  • ISSN
    1343-9677
  • NDL Article ID
    029872101
  • NDL Call No.
    Z74-B258
  • Data Source
    NDL  J-STAGE 
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