A bulk measurement technique for organic thin-film transistor arrays by a gate modulation imaging technique

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  • TSUTSUMI Jun'ya
    Flexible Electronics Research Center (FLEC), National Institute of Advanced Industrial Science and Technology (AIST)
  • MATSUOKA Satoshi
    Flexible Electronics Research Center (FLEC), National Institute of Advanced Industrial Science and Technology (AIST) Department of Chemistry, Faculty of Pure and Applied Sciences, University of Tsukuba
  • HASEGAWA Tatsuo
    Flexible Electronics Research Center (FLEC), National Institute of Advanced Industrial Science and Technology (AIST) Department of Applied Physics, The University of Tokyo

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Other Title
  • ゲート変調イメージングによる有機TFTアレイの一括評価技術
  • ゲート ヘンチョウ イメージング ニ ヨル ユウキ TFT アレイ ノ イッカツ ヒョウカ ギジュツ

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Abstract

<p>We report on the application of a gate-modulation (GM) imaging technique for fast and grouped inspection of organic thin-film transistor (OTFT) array operations. The method allows visualizing charge carriers accumulated in the OTFT array by time-translational differential image sensing with the use of a charge-coupled device (CCD) sensor. The feature makes it possible to visualize the dead pixels, broken channels, or distributed device performance in the OTFT array. We discuss how to correlate the spectroscopic information of a GM signal with the device performance and how to use this technique in the collective inspection of an OTFT array.</p>

Journal

  • Oyo Buturi

    Oyo Buturi 85 (12), 1037-1041, 2016-12-10

    The Japan Society of Applied Physics

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