State of the Art X-ray Diffraction Methods for Measuring Stress State in a Single Crystal
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- Imafuku Muneyuki
- Materials Characterization Center, Nippon Steel Technoresearch Corporation
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- Akita Koichi
- Department of Mechanical Systems Engineering, Musashi Institute of Technology
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- Shobu Takahisa
- Synchrotron Radiation Research Center, Quantum Beam Science Directrate, Japan Atomic Energy Agency
抄録
Two types of x-ray diffraction methods for measuring stress state in a single crystal are proposed. The first one is tuned to the laboratory x-ray diffraction system. The diffraction data for several equivalent diffraction indices are obtained by using our original apparatus and the multiple regression analysis method is applied for the solution algorism of the plane stress components. The second one is suitable for investigating the residual stress state in an inner part of a single crystal by using high energy synchrotron radiation facility. The stress components can be directly analyzed by solving the stress-strain equation for a single crystal with the diffraction data in three orthogonal directions. The experimental demonstrations are also shown for the residual stress analysis of laser-irradiated Fe single crystal.
収録刊行物
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- Transactions of the Materials Research Society of Japan
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Transactions of the Materials Research Society of Japan 33 (2), 381-384, 2008-06-01
一般社団法人 日本MRS
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詳細情報 詳細情報について
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- CRID
- 1390565134835646464
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- NII論文ID
- 130007809438
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- ISSN
- 21881650
- 13823469
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可