A Feasibility Study on X-Ray Stress Measurement with CdTe Pixel Detector

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  • SUZUKI Kenji
    Faculty of Education, Niigata University
  • SHIRO Ayumi
    Kansai Photon Science Institute, National Institutes for Quantum and Radiological Science and Technology
  • TOYOKAWA Hidenori
    Japan Synchrotron Radiation Research Institute
  • SAJI Choji
    Japan Synchrotron Radiation Research Institute
  • SHOBU Takahisa
    Material Sciences Research Center, Japan Atomic Energy Agency

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  • CdTe ピクセル検出器による応力評価の実証的研究
  • CdTe ピクセル ケンシュツキ ニ ヨル オウリョク ヒョウカ ノ ジッショウテキ ケンキュウ

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Abstract

<p>In this paper, we proposed a double exposure method using synchrotron white X-rays (DEM-WX) to measure strains of coarse-grained materials, and examined its feasibility. The X-ray diffractions were measured by a CdTe pixel detector. The CdTe pixel detector can resolve photon energy by changing a threshold voltage. Calibrating each pixel of the detector using characteristic X-rays of Pb and W foils, the images by threshold X-ray energy were obtained. The difference image, which is like a diffraction image with mono-chromatic X-rays, could be calculated by the difference between the images by the threshold X-ray energy. The material of the bending specimen was an austenitic stainless steel with a grain size of 300 µm. The strains of the bending specimen were measured using the DEM-WX, and the results corresponded to the applied strains measured by the strain gauge.</p>

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