Reducing Cracking in Solder Joint Interfacial Cu<sub>6</sub>Sn<sub>5</sub> with Modified Reflow Profile
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- Somidin Flora
- Nihon Superior Centre for the Manufacture of Electronic Materials (NS CMEM), School of Mechanical and Mining Engineering, The University of Queensland Centre of Excellence Geopolymer and Green Technology, School of Materials Engineering, Universiti Malaysia Perlis (UniMAP)
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- McDonald Stuart David
- Nihon Superior Centre for the Manufacture of Electronic Materials (NS CMEM), School of Mechanical and Mining Engineering, The University of Queensland
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- Ye Xiaozhou
- Nihon Superior Centre for the Manufacture of Electronic Materials (NS CMEM), School of Mechanical and Mining Engineering, The University of Queensland
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- Qu Dongdong
- Nihon Superior Centre for the Manufacture of Electronic Materials (NS CMEM), School of Mechanical and Mining Engineering, The University of Queensland
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- Sweatman Keith
- Nihon Superior Centre for the Manufacture of Electronic Materials (NS CMEM), School of Mechanical and Mining Engineering, The University of Queensland Nihon Superior Co. Ltd.
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- Akaiwa Tetsuya
- Nihon Superior Co. Ltd.
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- Nishimura Tetsuro
- Nihon Superior Co. Ltd.
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- Nogita Kazuhiro
- Nihon Superior Centre for the Manufacture of Electronic Materials (NS CMEM), School of Mechanical and Mining Engineering, The University of Queensland
抄録
<p>The polymorphic transformation that occurs in the Cu6Sn5 intermetallic compound (IMC) at 186°C has the potential to generate stresses that could lead to cracking of that phase in soldered joints during the multiple reflow cycles of a typical printed board assembly process and the thermal cycles to which electronic assemblies are exposed during service. In this paper the authors report on the effect of variations in the cooling stage of a reflow soldering thermal profile on the incidence and extent of cracking in the Cu6Sn5 at the interface between solder alloys and copper substrates. The solder alloy/substrate combinations studied were Sn-3.0Ag-0.5Cu/Cu and Sn-0.7Cu-0.05Ni-1.5Bi/Cu. The cooling conditions were (i) the direct-cooling of a conventional reflow profile, and (ii) an alternative reflow profile with one of three extended isothermal holding periods of 30, 60, and 180 seconds at 140°C during the cooling stage. It was found that the alternative reflow profiles reduced cracking in the interfacial Cu6Sn5 IMC layer and this resulted in improved resistance of the reflowed solder ball to failure in high speed impact shear when the distribution of stress tends to favor crack propagation though the interfacial IMC rather than through the bulk solder.</p>
収録刊行物
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- Transactions of The Japan Institute of Electronics Packaging
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Transactions of The Japan Institute of Electronics Packaging 13 (0), E19-004-1-E19-004-11, 2020
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詳細情報 詳細情報について
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- CRID
- 1390566775136890880
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- NII論文ID
- 130007847912
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- ISSN
- 18848028
- 18833365
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可