Magnetic Measurements of Narrow-Gap Semiconductor FeSb₂ under High Pressure
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- Deguchi Takuya
- Graduate School of Science and Engineering, Kagoshima University
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- Matsubayashi Kazuyuki
- Institute for Solid State Physics, University of Tokyo
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- Uwatoko Yoshiya
- Institute for Solid State Physics, University of Tokyo
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- Koyama Takehide
- Graduate School of Material Science, University of Hyogo
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- Kohara Takao
- Graduate School of Material Science, University of Hyogo
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- Nakamura Hiroyuki
- Department of Materials Science and Engineering, Kyoto University
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- Mitsui Yoshifuru
- Graduate School of Science and Engineering, Kagoshima University
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- Koyama Keiichi
- Graduate School of Science and Engineering, Kagoshima University
書誌事項
- タイトル別名
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- Magnetic Measurements of Narrow-Gap Semiconductor FeSb<sub>2</sub> under High Pressure
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<p>Pressure effects on magnetic susceptibility χ and energy gap Eg0 of narrow-gap semiconductor FeSb2 were investigated for the temperature range of 50–300 K and pressures up to 13 kbar. The estimated Eg0 for ambient pressure, Eg0(0), was 29 meV. By application of pressure, χ was suppressed, and Eg0(P) was estimated to be 52 meV for 13 kbar. The fourth-order expansion coefficient γ of the free energy in magnetization was positive and enhanced by applying pressures.</p>
収録刊行物
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- MATERIALS TRANSACTIONS
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MATERIALS TRANSACTIONS 61 (8), 1476-1479, 2020-07-01
公益社団法人 日本金属学会
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詳細情報 詳細情報について
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- CRID
- 1390566775154513152
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- NII論文ID
- 130007879849
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- NII書誌ID
- AA1151294X
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- ISSN
- 13475320
- 13459678
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- NDL書誌ID
- 030541066
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDL
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- KAKEN
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- 使用不可