Applications of Programmable Josephson Voltage Standard for AC Voltage Metrology
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- AMAGAI Yasutaka
- Research Institute for Physical Measurement, National Institute of Advanced Industrial Science and Technology (AIST)
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- MARUYAMA Michitaka
- Research Institute for Physical Measurement, National Institute of Advanced Industrial Science and Technology (AIST)
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- YAMAMORI Hirotake
- Nanoelectronics Research Institute, National Institute of Advanced Industrial Science and Technology (AIST)
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- SHIMAZAKI Takeshi
- Research Institute for Physical Measurement, National Institute of Advanced Industrial Science and Technology (AIST)
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- OKAWA Kenjiro
- Research Institute for Physical Measurement, National Institute of Advanced Industrial Science and Technology (AIST)
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- FUJIKI Hiroyuki
- Research Institute for Physical Measurement, National Institute of Advanced Industrial Science and Technology (AIST)
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- KANEKO Nobu-Hisa
- Research Institute for Physical Measurement, National Institute of Advanced Industrial Science and Technology (AIST)
Bibliographic Information
- Other Title
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- プログラマブル型ジョセフソン電圧標準の交流応用
- プログラマブルガタ ジョセフソン デンアツ ヒョウジュン ノ コウリュウ オウヨウ
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Abstract
<p>Over the last half-century, the most fundamental measurement of AC voltage has been done by comparing the Joule heating of an unknown AC signal to that of a reference direct DC voltage using thermal voltage converters (TVCs). However, the accuracy of AC-DC difference measurements of the TVC is limited by the accuracy of the model describing the AC-DC difference of the reference TVC. To satisfy the requirements for improved AC voltage metrology, national metrology institutes are developing quantum standards based upon the Josephson effect. These quantum-based AC voltage standards have significant advantages over a conventional measurement method in terms of accuracy and versatility. This article reviews the fundamental principle of AC voltage measurements with a conventional method based on a TVC and application of the AC-programmable Josephson voltage standard system using a sampling technique for the measurement of the AC-DC difference at low frequency.</p>
Journal
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- TEION KOGAKU (Journal of Cryogenics and Superconductivity Society of Japan)
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TEION KOGAKU (Journal of Cryogenics and Superconductivity Society of Japan) 55 (6), 420-427, 2020-11-20
CRYOGENICS AND SUPERCONDUCTIVITY SOCIETY OF JAPAN
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Details 詳細情報について
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- CRID
- 1391975276375028608
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- NII Article ID
- 130007949561
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- NII Book ID
- AN00333419
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- ISSN
- 18800408
- 03892441
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- NDL BIB ID
- 030786045
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- Text Lang
- ja
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- Data Source
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- JaLC
- NDL
- Crossref
- CiNii Articles
- KAKEN
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- Abstract License Flag
- Disallowed