Visual Simulation of Fine-particles Taking Yield Criteria into Account
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- SHIKAMA Shuto
- Keio University
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- KAWADA Genichi
- 株式会社デジタル・フロンティア
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- FUJISHIRO Issei
- Keio University
Bibliographic Information
- Other Title
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- 崩壊条件を考慮した付着性細粒子のビジュアルシミュレーション
Abstract
Fine particles are defined as a mass of solid particles whose radii are smaller than 200µm. In particular, finer particles with radius smaller than 100µm are called adhesive fine particles, because those particles tend to adhere to one another. Adhesive fine particles are ubiquitous in our daily life; four and powdered medicine are good examples of those. In this study, we attempted to model the behavior of adhesive fine-particles, which had never been reported in the literature. First, we adopted a representative particle model to narrow the dynamic range of the computation, though the existing model itself does not take inner frictions into account, which motivated us to allow each of the particles to hold its yield criteria. Our method successfully reduced the computational complexity and realized a feasible simulation of characteristic cracks on the surface of adhesive fine particles.
Journal
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- ITE Technical Report
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ITE Technical Report 41.12 (0), 37-40, 2021
The Institute of Image Information and Television Engineers
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Details 詳細情報について
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- CRID
- 1390007138538306688
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- NII Article ID
- 130008062907
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- ISSN
- 24241970
- 13426893
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- Text Lang
- ja
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- Data Source
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- JaLC
- CiNii Articles
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- Abstract License Flag
- Disallowed