Design a Continuous Switching Test Circuit for Power Devices to Evaluate Reliability

• Hayashi Shin-Ichiro

  Tokyo Metropolitan University

• Wada Keiji

  Tokyo Metropolitan University

Abstract

This study presents a design method for the continuous switching test circuits of power devices. Depending on the relationship between the rated voltage of a DC voltage source and device under test (DUT), two types of test circuits are proposed. These test circuits comprise a cascaded buck-boost (or boost-buck) converter to achieve power regeneration. Based on analysis of the test circuits, a design method is proposed to ensure that any failure does not spread to the test circuit even when the DUT fails during the continuous switching tests. A test circuit is designed according to the proposed method, and its experimental results demonstrate the validity of the proposed design.

Journal

• IEEJ Journal of Industry Applications

  IEEJ Journal of Industry Applications 11 (1), 108-116, 2022-01-01

  The Institute of Electrical Engineers of Japan

Keywords

• continuous switching test
• long-term reliability
• SiC MOSFET

Details

• CRID: 1390572092344621056
• NII Article ID: 130008139362
• DOI: 10.1541/ieejjia.21004267
• ISSN: 21871108
• ISSN: 21871094
• NDL BIB ID: 031899106
• Web Site: http://id.ndl.go.jp/bib/031899106
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I031899106
• Web Site: https://www.jstage.jst.go.jp/article/ieejjia/11/1/11_21004267/_pdf
• Text Lang: en
• Data Source:
  • JaLC
  • NDL
  • Crossref
  • CiNii Articles
  • KAKEN
• Abstract License Flag: Disallowed