Evaluation of a True Random Number Generator Utilizing Timing Jitters in RSFQ Logic Circuits
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- SATO Kenta
- The University of Electro-Communications
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- SEGA Naonori
- The University of Electro-Communications
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- SOMEI Yuta
- The University of Electro-Communications
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- SHIMADA Hiroshi
- The University of Electro-Communications
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- ONOMI Takeshi
- Fukuoka Institute of Technology
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- MIZUGAKI Yoshinao
- The University of Electro-Communications
Abstract
<p>We experimentally evaluated random number sequences generated by a superconducting hardware random number generator composed of a Josephson-junction oscillator, a rapid-single-flux-quantum (RSFQ) toggle flip-flop (TFF), and an RSFQ AND gate. Test circuits were fabricated using a 10 kA/cm2 Nb/AlOx/Nb integration process. Measurements were conducted in a liquid helium bath. The random numbers were generated for a trigger frequency of 500 kHz under the oscillating Josephson-junction at 29 GHz. 26 random number sequences of 20 kb length were evaluated for bias voltages between 2.0 and 2.7 mV. The NIST FIPS PUBS 140-2 tests were used for the evaluation. 100% pass rates were confirmed at the bias voltages of 2.5 and 2.6 mV. We found that the Monobit test limited the pass rates. As numerical simulations suggested, a detailed evaluation for the probability of obtaining “1” demonstrated the monotonical dependence on the bias voltage.</p>
Journal
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- IEICE Transactions on Electronics
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IEICE Transactions on Electronics E105.C (6), 296-299, 2022-06-01
The Institute of Electronics, Information and Communication Engineers
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Details 詳細情報について
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- CRID
- 1390855201278691584
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- NII Article ID
- 130008142640
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- ISSN
- 17451353
- 09168524
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- Text Lang
- en
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- Data Source
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- JaLC
- IRDB
- Crossref
- CiNii Articles
- KAKEN
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- Abstract License Flag
- Disallowed