Thickness dependence of dielectric constant of alumina film based on first-principles calculations

• Fukushima S.

  Dept. of Phys., Kumamoto Univ.

• Kumazoe H.

  Dept. of Phys., Kumamoto Univ.

• Tiwari S.

  Univ. of Southern California

• Shimojo F.

  Kumamoto Univ.

• Nakano A.

  Univ. of Southern California

• Kalia Rajiv K.

  Univ. of Southern California

• Vashishta P.

  Univ. of Southern California

Bibliographic Information

Other Title

• 第一原理計算に基づく薄膜アルミナの比誘電率の膜厚依存性

Journal

• Meeting Abstracts of the Physical Society of Japan

  Meeting Abstracts of the Physical Society of Japan 74.1 (0), 2417-2417, 2019

  The Physical Society of Japan

Keywords

• 表面界面構造
• 絶縁体
• 理論・シミュレーション

Details

• CRID: 1390853879727269376
• NII Article ID: 130008147454
• DOI: 10.11316/jpsgaiyo.74.1.0_2417
• ISSN: 21890803
• Text Lang: ja
• Data Source:
  • JaLC
  • CiNii Articles