ソフトウェアを対象にした構成テストの設計  [in Japanese] Design of Configuration Testing  [in Japanese]

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Author(s)

    • 西 康晴 NISHI Yasuharu
    • 東京大学大学院工学系研究科化学システム工学専攻 Department of Chemical System Engineering, Graduate School of Engineering, The Univ. of Tokyo.
    • 飯塚 悦功 IIZUKA Yoshinori
    • 東京大学大学院工学系研究科化学システム工学専攻 Department of Chemical System Engineering, Graduate School of Engineering, The Univ. of Tokyo.

Journal

  • The Transactions of the Institute of Electronics,Information and Communication Engineers.

    The Transactions of the Institute of Electronics,Information and Communication Engineers. 00841(00011), 1542-1552, 2001-11-01

    電子情報通信学会

References:  11

Cited by:  1

Codes

  • NII Article ID (NAID)
    20000106749
  • NII NACSIS-CAT ID (NCID)
    AA11341020
  • Text Lang
    JPN
  • Article Type
    Journal Article
  • ISSN
    09151915
  • NDL Article ID
    5962525
  • NDL Source Classification
    ZN33(科学技術--電気工学・電気機械工業--電子工学・電気通信)
  • NDL Call No.
    Z16-779
  • Data Source
    CJP  CJPref  NDL 
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