Jahn-Teller Effect of Cu-Ferrite Films.

• Tanaka T.

  Faculty of Engineering, Tokai Univ.

• Fukae S.

  Faculty of Engineering, Tokai Univ.

• Chiba M.

  Faculty of High Technology, Tokai Univ.

• Okimura H.

  Faculty of Engineering, Tokai Univ.

• Koizumi Y.

  Faculty of Engineering, Tokai Univ.

Bibliographic Information

Other Title

• Ｃｕフェライト膜のヤーン‐テラー効果

Abstract

Copper iron oxide (CuFe₂O₄: Cu-ferrite) thin films were prepared on a glass substrate by vacuum evaporation and solid reaction, and annealed at 300-500°C in the air. Their crystallographic structures, magnetic properties, and electrical conductivities were investigated. The obtained films were identified by X-ray diffraction analysis as Cu-ferrite films of a tetragonal system with an axial ratio (c/a) of 1.507. The saturation magnetization 4 πM_s, coercive force H_c, and Curie temperature T_c were 2.4 kG, 420 Oe, and 460°C, respectively. The temperature dependence of the magnetization and conductivity for the films showed remarkable changes at 360°C, which were considered to be caused by dislocation of the crystal structure due to the Jahn-Teller effect.

Journal

• Journal of the Magnetics Society of Japan

  Journal of the Magnetics Society of Japan 20 (2), 265-268, 1996

  The Magnetics Society of Japan

Keywords

• Cu-ferrite
• solid reaction
• Jahn-Teller effect

Details

• CRID: 1390282680070021504
• NII Article ID: 20000345981
• NII Book ID: AN0031390X
• DOI: 10.3379/jmsjmag.20.265
• COI: 1:CAS:528:DyaK28XivFChtbo%3D
• ISSN: 18804004
• ISSN: 02850192
• ISSN: http://id.crossref.org/issn/02850192
• Text Lang: ja
• Data Source:
  • JaLC
  • Crossref
  • CiNii Articles
• Abstract License Flag: Disallowed