書誌事項
- タイトル別名
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- Exchange Coupling between CrMn-Based Antiferromagnetic Films and NiFe Films.
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We investigated the exchange coupling between ferromagnetic Ni81Fe19 and antiferromagnetic CrMn alloy films. The exchange coupling field (HEX) of CrMn alloy film, with 40 nm Ni81Fe19 film is 5 Oe at 50 at% Mn content. If several at% of Cu, Pt, Pd, and Rh are added to Cr50Mn50 films, HEX is approximately 16 Oe. In the case of Pt addition, HEX increases with increasing Pt content and saturates at more than 5 at% Pt. CrMnPt (110) films with body-centered cubic structures are formed on NiFe (111) films. With increasing sputtering Ar gas pressure, both HEX and the blocking temperature (<i>T</i>B) of Ni81Fe19/Cr46Mn46Pt8 increase. At an Ar gas pressure of 15 mTorr, HEx and TB are 15 Oe and 380°C, respectively. HEX of Ni81Fe19/Cr46Mn46Pt8 films decreases with decreasing CrMnPt film thickness, and at least 30 nm thickness is required in order to maintain a positive value of HEX. From these results, we conclude that it may be possible to use antiferromagnetic CrMnPt film in MR heads and spin-valve films.
収録刊行物
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- 日本応用磁気学会誌
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日本応用磁気学会誌 20 (2), 357-360, 1996
公益社団法人 日本磁気学会
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詳細情報 詳細情報について
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- CRID
- 1390001205093336448
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- NII論文ID
- 20000346205
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- NII書誌ID
- AN0031390X
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- COI
- 1:CAS:528:DyaK28XivFChu7k%3D
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- ISSN
- 18804004
- 02850192
- http://id.crossref.org/issn/02850192
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- 本文言語コード
- ja
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可