Determination of multiple trace element compositions in thin (<30 μm) layers of NIST SRM 614 and 616 using laser ablation ICP-MS

• MORISHITA T.

収録刊行物

• Geostand. Geoanal. Res.

  Geostand. Geoanal. Res. 29 107-122, 2005

詳細情報

• CRID: 1570854174295122048
• NII論文ID: 20001226416
• データソース種別:
  • CiNii Articles