Improved ^<14>C dating of a tephra layer (AT tephra, Japan) using AMS on selected organic fractions

Author(s)

Journal

  • Nucl. Instrum. Meth. B

    Nucl. Instrum. Meth. B 223-224, 555-559, 2004

Cited by:  1

Codes

  • NII Article ID (NAID)
    20001353264
  • Article Type
    Journal Article
  • Data Source
    CJPref 
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