Electrical characterization of defects introduced during electron beam deposition of Schottky contacts on n-type Ge

• AURET F. D.

収録刊行物

• Mat. Sci. Semicond. Proc.

  Mat. Sci. Semicond. Proc. 9 576-579, 2006

詳細情報

• CRID: 1570572699317213568
• NII論文ID: 20001488967
• データソース種別:
  • CiNii Articles