<i>In situ</i>Real-Time X-ray Reciprocal Space Mapping during InGaAs/GaAs Growth for Understanding Strain Relaxation Mechanisms

• Takuo Sasaki

• Hidetoshi Suzuki

• Akihisa Sai

• Jong-Han Lee

• Masamitu Takahasi

• Seiji Fujikawa

• Koji Arafune

• Itaru Kamiya

• Yoshio Ohshita

• Masafumi Yamaguchi

収録刊行物

• Applied Physics Express

  Applied Physics Express 2 085501-, 2009-07-17

  IOP Publishing

キーワード

• General Physics and Astronomy
• General Engineering

詳細情報

• CRID: 1360847871764615936
• NII論文ID: 210000014443
• DOI: 10.1143/apex.2.085501
• ISSN: 18820786
• ISSN: 18820778
• Web Site: http://stacks.iop.org/1882-0786/2/i=8/a=085501/pdf
• データソース種別:
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  • CiNii Articles