Experimental and Theoretical Analysis of Degradation in Ga₂O₃–In₂O₃–ZnO Thin-Film Transistors

• Mami Fujii

• Yukiharu Uraoka

• Takashi Fuyuki

• Ji Sim Jung

• Jang Yeon Kwon

Journal

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 48 (4S), 04C091-, 2009-04-01

  IOP Publishing

Details

• CRID: 1360566396808074752
• NII Article ID: 210000066602
• DOI: 10.1143/jjap.48.04c091
• ISSN: 13474065
• ISSN: 00214922
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.48.04C091
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.48.04C091/pdf
• Data Source:
  • Crossref
  • CiNii Articles