Solution–TiO₂Interface Probed by Frequency-Modulation Atomic Force Microscopy

• Takumi Hiasa

• Kenjiro Kimura

• Hiroshi Onishi

• Masahiro Ohta

• Kazuyuki Watanabe

• Ryohei Kokawa

• Noriaki Oyabu

• Kei Kobayashi

• Hirofumi Yamada

Journal

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 48 (8), 08JB19-, 2009-08-20

  IOP Publishing

Keywords

• General Physics and Astronomy
• Physics and Astronomy (miscellaneous)
• General Engineering

Details

• CRID: 1360003446854944512
• NII Article ID: 210000067325
• DOI: 10.1143/jjap.48.08jb19
• ISSN: 13474065
• ISSN: 00214922
• Data Source:
  • Crossref
  • CiNii Articles