Study of the Degradation of p–n Diode Characteristics Caused by Small-Angle Grain Boundaries in Multi-Crystalline Silicon Substrate for Solar Cells 2009-12-21

Access this Article

Journal

  • Japanese Journal of Applied Physics

    Japanese Journal of Applied Physics 48(12), 121202-121202, 2009-12-21

    Japan Society of Applied Physics

Codes

  • NII Article ID (NAID)
    210000067693
  • ISSN
    0021-4922
  • Data Source
    Crossref 
Page Top