Study of the Degradation of p–n Diode Characteristics Caused by Small-Angle Grain Boundaries in Multi-Crystalline Silicon Substrate for Solar Cells

• Tomihisa Tachibana

• Junichi Masuda

• Keita Imai

• Atsushi Ogura

• Yoshio Ohshita

• Koji Arafune

• Michio Tajima

Journal

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 48 (12), 121202-, 2009-12-21

  IOP Publishing

Keywords

• General Physics and Astronomy
• Physics and Astronomy (miscellaneous)
• General Engineering

Details

• CRID: 1360003446855102208
• NII Article ID: 210000067693
• DOI: 10.1143/jjap.48.121202
• ISSN: 13474065
• ISSN: 00214922
• Data Source:
  • Crossref
  • CiNii Articles