Full Three-Dimensional Simulation of Ion-Sensitive Field-Effect Transistor Flatband Voltage Shifts Due to DNA Immobilization and Hybridization

• Shigeyasu Uno

• Mami Iio

• Hiroaki Ozawa

• Kazuo Nakazato

Journal

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 49 (1), 01AG07-, 2010-01-20

  IOP Publishing

Keywords

• General Physics and Astronomy
• Physics and Astronomy (miscellaneous)
• General Engineering

Details

• CRID: 1360566396808596352
• NII Article ID: 210000067869
• DOI: 10.1143/jjap.49.01ag07
• ISSN: 13474065
• ISSN: 00214922
• Data Source:
  • Crossref
  • CiNii Articles