Investigations of Local Electrical Properties of Pentacene Thin Films by Dual-Probe Atomic Force Microscopy

• Masaharu Hirose

• Eika Tsunemi

• Kei Kobayashi

• Hirofumi Yamada

• Kazumi Matsushige

抄録

We performed local electrical transport measurement on single grains of a pentacene thin film using a lab-built dual-probe atomic force microscopy (DP-AFM) system. We brought two conducting cantilever tips in contact with a single grain and successfully measured the p-type field-effect characteristics. Moreover, we investigated the effect of contact resistance on the measured characteristics by performing a series of transport measurements while varying tip distance. The contact resistance and hole mobility of the channel region were estimated as 3.1 GΩ and 2.7×10 -2 cm 2 V -1 s -1 , respectively. The results demonstrate the applicability of the DP-AFM system to the nanometer-scale transport measurement of molecules.

収録刊行物

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 49 (8S3), 08LB10-, 2010-08-01

  IOP Publishing

キーワード

• General Physics and Astronomy
• General Engineering

詳細情報

• CRID: 1360566396809109376
• NII論文ID: 210000069133
• DOI: 10.1143/jjap.49.08lb10
• ISSN: 13474065
• ISSN: 00214922
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.49.08LB10
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.49.08LB10/pdf
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