Development of High-Resolution Imaging of Solid–Liquid Interface by Frequency Modulation Atomic Force Microscopy

• Katsuyuki Suzuki

• Shin-ichi Kitamura

• Shukichi Tanaka

• Kei Kobayashi

• Hirofumi Yamada

抄録

The high-resolution imaging technique used in liquid environments involving dynamic mode atomic force microscopy (AFM) with a frequency modulation (FM) detection technique has been newly developed on the basis of a commercial atomic force microscopy (AFM) apparatus, which is, generally, extremely difficult because of the large decrease in Q-factor caused by hydrodynamic damping in liquids. Through various improvements and optimization, the noise density of the improved deflection sensor was 29 fm/√Hz ( f 0 = 141 kHz) in liquid. In addition, the noise level and bandwidth of the FM detector were improved to 6 mHz/√Hz and 6 kHz, respectively. Thermal drift was successfully regulated at less than 1 nm/min in air for a sufficiently long time without any special air conditioning treatments. As a result, we succeeded in obtaining high-resolution images of polypropylene sheet, Au thin film, and DNA structures in a buffer solution. Therefore, liquid environments are proved to be suitable for high-resolution imaging by FM-AFM under ultrahigh vacuum (UHV) condition.

収録刊行物

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 49 (8S3), 08LB12-, 2010-08-01

  IOP Publishing

キーワード

• General Physics and Astronomy
• General Engineering

詳細情報

• CRID: 1360566396809110400
• NII論文ID: 210000069135
• DOI: 10.1143/jjap.49.08lb12
• ISSN: 13474065
• ISSN: 00214922
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.49.08LB12
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.49.08LB12/pdf
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