Evaluation of a Delay-Line Detector Combined with Analog-to-Digital Converters as the Ion Detection System for Stigmatic Imaging Mass Spectrometry

• Hidetoshi Yoshimura

• Hisanao Hazama

• Jun Aoki

• Michisato Toyoda

• Yasuhide Naito

• Kunio Awazu

抄録

In addition to identifying analytes from the time-of-flight of ions, stigmatic imaging mass spectrometry (IMS) realizes microscopic and high-throughput imaging of multiple mass-resolved molecules. However, practical applications require a fast position- and time-sensitive ion detector. We have developed a delay-line detector combined with analog-to-digital converters (ADCs), and evaluated its performance as an ion detector for stigmatic IMS using electron ionization. The system shows spatial and temporal resolutions of 230 µm and 24 ns (4.2 ×10 7 frames per second), respectively. We speculate that the timing jitter of the signals limits the spatial resolution due to the signal processing devices. At a 20-fold ion optical magnification and m / z of 10,000, the estimated spatial resolution and mass resolving power m /Δ m using this ion detection system with a stigmatic imaging mass spectrometer, which we are currently developing, are 12 µm and 15,000, respectively.

収録刊行物

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 50 (5R), 056701-, 2011-05-01

  IOP Publishing

キーワード

• General Physics and Astronomy
• General Engineering

詳細情報

• CRID: 1360566396809628928
• NII論文ID: 210000070469
• DOI: 10.1143/jjap.50.056701
• ISSN: 13474065
• ISSN: 00214922
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.50.056701
• Web Site: https://iopscience.iop.org/article/10.1143/JJAP.50.056701/pdf
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