Evaluation of the potential distribution in a multiple stacked Si quantum dots structure by hard X-ray photoelectron spectroscopy
Journal
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 58 (SA), SAAE01-, 2018-11-26
IOP Publishing
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Details 詳細情報について
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- CRID
- 1360284924859069312
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- NII Article ID
- 210000135209
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- ISSN
- 13474065
- 00214922
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- Data Source
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- Crossref
- CiNii Articles
- KAKEN