Degradation mechanism of perovskite CH₃NH₃PbI₃ diode devices studied by electroluminescence and photoluminescence imaging spectroscopy

• Makoto Okano

• Masaru Endo

• Atsushi Wakamiya

• Masahiro Yoshita

• Hidefumi Akiyama

• Yoshihiko Kanemitsu

Journal

• Applied Physics Express

  Applied Physics Express 8 (10), 102302-, 2015-10-01

  IOP Publishing

Keywords

• General Physics and Astronomy
• General Engineering

Details

• CRID: 1360003449884440704
• NII Article ID: 210000137670
• DOI: 10.7567/apex.8.102302
• ISSN: 18820786
• ISSN: 18820778
• Web Site: http://stacks.iop.org/1882-0786/8/i=10/a=102302/pdf
• Web Site: http://stacks.iop.org/1882-0786/8/i=10/a=102302?key=crossref.cc1483cf06cedfe27c35512982c598eb
• Data Source:
  • Crossref
  • CiNii Articles
  • KAKEN