Crystal phase transition to green emission wurtzite AlInP by crystal structure transfer

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<jats:title>Abstract</jats:title> <jats:p>We grew AlInP on two types of GaN substrate in order to transfer the wurtzite (WZ) structure to grown layers. An AlInP epitaxial layer grown on GaN<jats:inline-formula> <jats:tex-math><?CDATA $(10\bar{1}0)$?></jats:tex-math> <jats:inline-graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="AP151071if001.gif" xlink:type="simple" /> </jats:inline-formula> with high-density stacking faults was obtained. X-ray diffraction and Raman scattering analyses indicate that the dominant crystal structure of the AlInP layer grown on GaN<jats:inline-formula> <jats:tex-math><?CDATA $(10\bar{1}0)$?></jats:tex-math> <jats:inline-graphic xmlns:xlink="http://www.w3.org/1999/xlink" xlink:href="AP151071if002.gif" xlink:type="simple" /> </jats:inline-formula> was WZ. Cathode luminescence measurements at 35 K revealed strong green emissions from the WZ AlInP layer, suggesting an energy band gap change from indirect to direct. These results demonstrate the potential of WZ AlInP as a new candidate for high-efficiency green emission material.</jats:p>

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