Nanoscale Evaluation of Structure and Surface Potential of Gated Field Emitters by Scanning Maxwell-Stress Microscope

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Journal

  • Japanese Journal of Applied Physics

    Japanese Journal of Applied Physics 34(12S), 6912-6912, 1995-12-01

    Japan Society of Applied Physics

Codes

  • NII Article ID (NAID)
    210000138148
  • ISSN
    0021-4922
  • Data Source
    Crossref 
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