Thickness Dependence of Extrinsic Dielectric Response in Reduced Ni-Doped KTaO<sub>3</sub>
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 51 (9S1), 09LC01-, 2012-09-01
IOP Publishing
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詳細情報 詳細情報について
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- CRID
- 1360003449885921920
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- NII論文ID
- 210000141242
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- ISSN
- 13474065
- 00214922
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- データソース種別
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- Crossref
- CiNii Articles