Impact of Body-Biasing Technique on Random Telegraph Noise Induced Delay Fluctuation

• Takashi Matsumoto

• Kazutoshi Kobayashi

• Hidetoshi Onodera

Bibliographic Information

Other Title

• Special Issue : Solid State Devices and Materials

Abstract

The statistical nature of random telegraph noise (RTN) induced delay fluctuation is described by measuring 1,655 ROs fabricated in a commercial 40 nm CMOS technology. A small number of samples have a large RTN-induced delay fluctuation. We investigated the impact of the body-biasing technique on RTN-induced circuit delay fluctuation for various substrate bias conditions. The impact of RTN-induced delay fluctuation tends to be reduced by the forward body-biasing technique, but a few ROs still have a large fluctuation.

Journal

• Japanese journal of applied physics : JJAP

  Japanese journal of applied physics : JJAP 52 (4), 04CE05-, 2013-04

  Tokyo : The Japan Society of Applied Physics

Keywords

• General Physics and Astronomy
• General Engineering

Details

• CRID: 1520009408993372416
• NII Article ID: 40019638305
• NII Article ID: 210000142035
• NII Book ID: AA12295836
• ISSN: 00214922
• ISSN: 13474065
• DOI: 10.7567/jjap.52.04ce05
• NDL BIB ID: 024439227
• Web Site: https://ndlsearch.ndl.go.jp/books/R000000004-I024439227
• Web Site: https://iopscience.iop.org/article/10.7567/JJAP.52.04CE05
• Web Site: https://iopscience.iop.org/article/10.7567/JJAP.52.04CE05/pdf
• Text Lang: en
• NDL Source Classification:
  • ZM35(科学技術--物理学)
• Data Source:
  • NDL
  • Crossref
  • CiNii Articles
  • KAKEN