Fabrication and Evaluation of One-Axis Oriented Lead Zirconate Titanate Films Using Metal–Oxide Nanosheet Interface Layer
抄録
<jats:p> Nanosheet Ca<jats:sub>2</jats:sub>Nb<jats:sub>3</jats:sub>O<jats:sub>20</jats:sub> (ns-CN) layers with pseudo-perovskite-type crystal configuration were applied on the surface of polycrystalline metal substrates to achieve preferential crystal orientation of Pb(Zr,Ti)O<jats:sub>3</jats:sub> (PZT) films for the purpose of enhanced ferroelectricity comparable to that of epitaxial thin films. PZT films with tetragonal symmetry (Zr/Ti=0.40:0.60) were fabricated by chemical solution deposition (CSD) on ns-CN-buffered Inconel 625 and SUS 316L substrates, while ns-CN was applied on the the substrates by dip-coating. The preferential crystal growth on the ns-CN layer can be achieved by favorable lattice matching between (001)/(100)PZT and (001)ns-CN planes. The degree of (001) orientation was increased for PZT films on ns-CN/Inconel 625 and ns-CN/SUS 316L substrates, whereas randomly-oriented PZT films with a lower degree of (001) orientation were grown on bare and Inconel 625 films. Enhanced remanent polarization of 60 µC/cm<jats:sup>2</jats:sup> was confirmed for the PZT films on ns-CN/metal substrates, ascribed to the preferential alignment of the polar [001] axis normal to the substrate surface, although it also suffered from higher coercive field above 500 kV/cm caused by PZT/metal interfacial reaction. </jats:p>
収録刊行物
-
- Japanese Journal of Applied Physics
-
Japanese Journal of Applied Physics 52 (9S1), 09KA04-, 2013-09-01
IOP Publishing
- Tweet
詳細情報 詳細情報について
-
- CRID
- 1360847874817880192
-
- NII論文ID
- 210000142820
-
- ISSN
- 13474065
- 00214922
- http://id.crossref.org/issn/13474065
-
- データソース種別
-
- Crossref
- CiNii Articles
- KAKEN