Quantitative evaluation of slow traps near Ge MOS interfaces by using time response of MOS capacitance

• Katsuhisa Tanaka

• Rui Zhang

• Mitsuru Takenaka

• Shinichi Takagi

収録刊行物

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 54 (4S), 04DA02-, 2015-02-17

  IOP Publishing

キーワード

• General Physics and Astronomy
• Physics and Astronomy (miscellaneous)
• General Engineering

詳細情報

• CRID: 1360003449889838976
• NII論文ID: 210000144949
• DOI: 10.7567/jjap.54.04da02
• ISSN: 13474065
• ISSN: 00214922
• Web Site: http://stacks.iop.org/1347-4065/54/i=4S/a=04DA02/pdf
• Web Site: http://stacks.iop.org/1347-4065/54/i=4S/a=04DA02?key=crossref.be8c8e39b1d9d487912b771cb5cce181
• データソース種別:
  • Crossref
  • CiNii Articles