Comparison and statistical analysis of four write stability metrics in bulk CMOS static random access memory cells

• Hao Qiu

• Tomoko Mizutani

• Takuya Saraya

• Toshiro Hiramoto

Journal

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 54 (4S), 04DC09-, 2015-02-23

  IOP Publishing

Keywords

• General Physics and Astronomy
• Physics and Astronomy (miscellaneous)
• General Engineering

Details

• CRID: 1360847874819981056
• NII Article ID: 210000144966
• DOI: 10.7567/jjap.54.04dc09
• ISSN: 13474065
• ISSN: 00214922
• Web Site: http://stacks.iop.org/1347-4065/54/i=4S/a=04DC09/pdf
• Web Site: http://stacks.iop.org/1347-4065/54/i=4S/a=04DC09?key=crossref.4249a1d8a60497a8eabee3944ddb8b39
• Data Source:
  • Crossref
  • CiNii Articles
  • KAKEN