Effect of III/V ratio on the polarity of AlN and GaN layers grown in the metal rich growth regime on Si(111) by plasma assisted molecular beam epitaxy
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 54 (6), 065701-, 2015-05-19
IOP Publishing
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詳細情報 詳細情報について
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- CRID
- 1360566399843379072
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- NII論文ID
- 210000145204
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- ISSN
- 13474065
- 00214922
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- データソース種別
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