Bias induced Cu ion migration behavior in resistive change memory structure observed by hard X-ray photoelectron spectroscopy

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Journal

  • Japanese Journal of Applied Physics

    Japanese Journal of Applied Physics 54(6S1), 06FG01-06FG01, 2015-04-14

    Japan Society of Applied Physics

Codes

  • NII Article ID (NAID)
    210000145237
  • ISSN
    0021-4922
  • Data Source
    Crossref 
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