Difference in etching between Si(111) and (001) surfaces induced by atomic hydrogen irradiation observed by noncontact atomic force microscopy
Journal
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 54 (8S2), 08LB08-, 2015-07-24
IOP Publishing
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Details 詳細情報について
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- CRID
- 1360284924866844672
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- NII Article ID
- 210000145637
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- ISSN
- 13474065
- 00214922
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- Data Source
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- Crossref
- CiNii Articles
- KAKEN