Transient analysis of oblique Hanle signals observed in GaAs

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Journal

  • Japanese Journal of Applied Physics

    Japanese Journal of Applied Physics 55(4S), 04EN03-04EN03, 2016-03-29

    IOP Publishing

Codes

  • NII Article ID (NAID)
    210000146407
  • ISSN
    0021-4922
  • Data Source
    Crossref 
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