Humidity effects on the redox reactions and ionic transport in a Cu/Ta₂O₅/Pt atomic switch structure

• Tohru Tsuruoka

• Ilia Valov

• Cedric Mannequin

• Tsuyoshi Hasegawa

• Rainer Waser

• Masakazu Aono

抄録

Redox reactions at the Cu/Ta 2 O 5 interface and subsequent Cu ion transport in a Ta 2 O 5 film have been investigated by means of cyclic voltammetry (CV) measurements. Under positive bias to the Cu electrode, Cu is preferentially oxidized to Cu 2+ and then to Cu + . Subsequent negative bias causes a reduction of the oxidized Cu ions at the interface. It was found that CV curves change drastically with varied relative humidity levels from 5 to 85%. At higher humidity levels, the ion concentrations and diffusion coefficients, estimated from the CV curves, suggest increased redox reaction rates and a significant contribution of proton conduction to the ionic transport. The results indicate that the redox reactions of moisture are rate-limiting and highlight the importance of water uptake by the matrix oxide film in understanding and controlling the resistive switching behavior of oxide-based atomic switches.

収録刊行物

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 55 (6S1), 06GJ09-, 2016-05-06

  IOP Publishing

詳細情報

• CRID: 1360847874820717056
• NII論文ID: 210000146651
• DOI: 10.7567/jjap.55.06gj09
• ISSN: 13474065
• ISSN: 00214922
• ISSN: http://id.crossref.org/issn/13474065
• Web Site: http://stacks.iop.org/1347-4065/55/i=6S1/a=06GJ09/pdf
• Web Site: http://stacks.iop.org/1347-4065/55/i=6S1/a=06GJ09?key=crossref.b0ac0332464b3891d463b0732091a916
• Web Site: https://iopscience.iop.org/article/10.7567/JJAP.55.06GJ09
• Web Site: https://iopscience.iop.org/article/10.7567/JJAP.55.06GJ09/pdf
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