Time-resolved crystal structure analysis of resonantly vibrating langasite oscillator

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<jats:title>Abstract</jats:title> <jats:p>The momentary crystal structure of a <jats:italic>Y</jats:italic>-cut langasite oscillator resonantly vibrating under an alternating electric field is revealed by time-resolved crystal structure analysis to understand the microscopic mechanism of piezoelectricity. The thickness-shear lattice strain under an electric field is amplified ∼10<jats:sup>3</jats:sup> times by the resonant effect. The lattice vibration involves the deformation of GaO<jats:sub>4</jats:sub> and Ga<jats:sub>0.5</jats:sub>Si<jats:sub>0.5</jats:sub>O<jats:sub>4</jats:sub> tetrahedra accompanied by atomic displacements of specific oxygen atoms along the electric field. The deformation of GaO<jats:sub>4</jats:sub> and Ga<jats:sub>0.5</jats:sub>Si<jats:sub>0.5</jats:sub>O<jats:sub>4</jats:sub> tetrahedra enhances the piezoelectricity of langasite.</jats:p>

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