Time-resolved crystal structure analysis of resonantly vibrating langasite oscillator
抄録
<jats:title>Abstract</jats:title> <jats:p>The momentary crystal structure of a <jats:italic>Y</jats:italic>-cut langasite oscillator resonantly vibrating under an alternating electric field is revealed by time-resolved crystal structure analysis to understand the microscopic mechanism of piezoelectricity. The thickness-shear lattice strain under an electric field is amplified ∼10<jats:sup>3</jats:sup> times by the resonant effect. The lattice vibration involves the deformation of GaO<jats:sub>4</jats:sub> and Ga<jats:sub>0.5</jats:sub>Si<jats:sub>0.5</jats:sub>O<jats:sub>4</jats:sub> tetrahedra accompanied by atomic displacements of specific oxygen atoms along the electric field. The deformation of GaO<jats:sub>4</jats:sub> and Ga<jats:sub>0.5</jats:sub>Si<jats:sub>0.5</jats:sub>O<jats:sub>4</jats:sub> tetrahedra enhances the piezoelectricity of langasite.</jats:p>
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 55 (10S), 10TC05-, 2016-08-30
IOP Publishing
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詳細情報 詳細情報について
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- CRID
- 1360847874820936704
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- NII論文ID
- 210000147184
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- ISSN
- 13474065
- 00214922
- http://id.crossref.org/issn/13474065
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- データソース種別
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- Crossref
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