Determination of band profiles in GaN films using hard X-ray photoelectron spectroscopy

• Shinji Saito

• Masahiko Yoshiki

• Shinya Nunoue

• Nobuyuki Sano

Journal

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 56 (2), 021003-, 2017-01-25

  IOP Publishing

Keywords

• General Physics and Astronomy
• Physics and Astronomy (miscellaneous)
• General Engineering

Details

• CRID: 1360566399844325632
• NII Article ID: 210000147416
• DOI: 10.7567/jjap.56.021003
• ISSN: 13474065
• ISSN: 00214922
• Web Site: http://stacks.iop.org/1347-4065/56/i=2/a=021003/pdf
• Web Site: http://stacks.iop.org/1347-4065/56/i=2/a=021003?key=crossref.506b937d9d5801e3ac9eddb4659bc773
• Data Source:
  • Crossref
  • CiNii Articles
  • KAKEN