A method for atomic-level noncontact thermometry with electron energy distribution

• Ikuo Kinoshita

• Chiharu Tsukada

• Kohei Ouchi

• Eiichi Kobayashi

• Juntaro Ishii

収録刊行物

• Japanese Journal of Applied Physics

  Japanese Journal of Applied Physics 56 (4), 048004-, 2017-03-17

  IOP Publishing

キーワード

• General Physics and Astronomy
• Physics and Astronomy (miscellaneous)
• General Engineering

詳細情報

• CRID: 1360284924867667456
• NII論文ID: 210000147541
• DOI: 10.7567/jjap.56.048004
• ISSN: 13474065
• ISSN: 00214922
• Web Site: http://stacks.iop.org/1347-4065/56/i=4/a=048004/pdf
• Web Site: http://stacks.iop.org/1347-4065/56/i=4/a=048004?key=crossref.f2e199aaf2463ec231db5adf3b868dc1
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