Suppression of tunneling rate fluctuations in tunnel field-effect transistors by enhancing tunneling probability
Journal
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 56 (4S), 04CD02-, 2017-02-09
IOP Publishing
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Details 詳細情報について
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- CRID
- 1360284924867676544
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- NII Article ID
- 210000147562
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- ISSN
- 13474065
- 00214922
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- Data Source
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- Crossref
- CiNii Articles
- KAKEN