Quantitative thickness measurement of polarity-inverted piezoelectric thin-film layer by scanning nonlinear dielectric microscopy
収録刊行物
-
- Japanese Journal of Applied Physics
-
Japanese Journal of Applied Physics 56 (10S), 10PF18-, 2017-09-28
IOP Publishing
- Tweet
詳細情報 詳細情報について
-
- CRID
- 1360003449891333504
-
- NII論文ID
- 210000148395
-
- ISSN
- 13474065
- 00214922
-
- データソース種別
-
- Crossref
- CiNii Articles
- KAKEN